Experimental Spectroscopic Data of SnO2 Films and Powder

Powders and films composed of tin dioxide (SnO2) are promising candidates for a variety high-impact applications, despite the material’s prevalence in such studies, it remains high importance that commercially available materials meet quality demands industries these would most benefit. Imaging techniques, as scanning electron microscopy (SEM), atomic force (AFM), were used conjunction with Raman spectroscopy X-ray photoelectron (XPS) to assess samples, powder thin film on quartz thicknesses 41 nm, 78 97 373 908 nm. In this study, dependencies corresponding Raman, XPS, SEM analysis results properties like thickness form (powder versus film) determined. The outcomes achieved can be regarded guide performing checks products, reference evaluate samples.